JPH0543265B2 - - Google Patents

Info

Publication number
JPH0543265B2
JPH0543265B2 JP6596086A JP6596086A JPH0543265B2 JP H0543265 B2 JPH0543265 B2 JP H0543265B2 JP 6596086 A JP6596086 A JP 6596086A JP 6596086 A JP6596086 A JP 6596086A JP H0543265 B2 JPH0543265 B2 JP H0543265B2
Authority
JP
Japan
Prior art keywords
signal
defect
value
gate
absolute value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP6596086A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62223652A (ja
Inventor
Minoru Tanaka
Mitsuyoshi Koizumi
Yoshimasa Ooshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP6596086A priority Critical patent/JPS62223652A/ja
Publication of JPS62223652A publication Critical patent/JPS62223652A/ja
Publication of JPH0543265B2 publication Critical patent/JPH0543265B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Recording Or Reproducing By Magnetic Means (AREA)
JP6596086A 1986-03-26 1986-03-26 欠陥検査装置 Granted JPS62223652A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6596086A JPS62223652A (ja) 1986-03-26 1986-03-26 欠陥検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6596086A JPS62223652A (ja) 1986-03-26 1986-03-26 欠陥検査装置

Publications (2)

Publication Number Publication Date
JPS62223652A JPS62223652A (ja) 1987-10-01
JPH0543265B2 true JPH0543265B2 (en]) 1993-07-01

Family

ID=13302062

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6596086A Granted JPS62223652A (ja) 1986-03-26 1986-03-26 欠陥検査装置

Country Status (1)

Country Link
JP (1) JPS62223652A (en])

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003014703A (ja) * 2001-07-04 2003-01-15 Sanshin Denshi:Kk 超音波気泡検出装置
US7425719B2 (en) * 2005-01-13 2008-09-16 Wd Media, Inc. Method and apparatus for selectively providing data from a test head to a processor
JP6791270B2 (ja) * 2017-01-26 2020-11-25 株式会社島津製作所 磁性体の検査装置および磁性体の検査方法

Also Published As

Publication number Publication date
JPS62223652A (ja) 1987-10-01

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